Membrane interface characterization by contact angle measurements and scanning-force-microscopy
No abstract available.
URL: https://publications.hereon.de/id/16536/
Authors:Kamusewitz, H., Paul, D., Keller, M.
Year:1993
In: The 1993 International Congress on Membranes and Membrane Processes
Location:Heidelberg (D)
Date:30. August -3. September 1993
Pages: 5.51
Type:Confpaper
Cite as: Kamusewitz, H.; Paul, D.; Keller, M.: Membrane interface characterization by contact angle measurements and scanning-force-microscopy. In: The 1993 International Congress on Membranes and Membrane Processes. Heidelberg (D), 30. August -3. September 1993, 1993. 5.51.
