Kinetics of interface reactions in polycrystalline thin films
No abstract available.
URL: https://publications.hereon.de/id/16172/
Authors:Bormann, R.
Year:1994
In: Polycristalline Thin Films: Structure, Texture, Properties and Applications
Location:San Francisco, CA (USA)
Date:04.-08.04.1994
Pages:169-180
Type:conference paper,conference lecture
Cite as: Bormann, R.: Kinetics of interface reactions in polycrystalline thin films. In: Barmak, K.; Parker, M.; Floro, J.; Sinclair, R.; Smith, D. (Ed.): Polycristalline Thin Films: Structure, Texture, Properties and Applications. San Francisco, CA (USA). 1994. 169-180.
