Ex-Situ Characterization of Phase Transformations and Associated Microstructures in Polycrystalline Thin Films

journal article

No abstract available.

URL: https://publications.hereon.de/id/16093/
Authors:Barmak, K.,Rickman, J. M.,Michaelsen, C.,Ristau, R. A.,Kim, J.,Lucadamo, G.,Carpenter, D. T.,Tong, W. S.
Year:1999
In: Journal of Vacuum Science and Technology A
Volume:17
Pages:1950-1957
Type:journal article
ISSN: 0734-2101
Cite as: Barmak, K.; Rickman, J.; Michaelsen, C.; Ristau, R.; Kim, J.; Lucadamo, G.; Carpenter, D.; Tong, W.: Ex-Situ Characterization of Phase Transformations and Associated Microstructures in Polycrystalline Thin Films. Journal of Vacuum Science and Technology A. 1999. vol. 17, 1950-1957.