Trace and surface analysis by total reflection XRF
No abstract available.
URL: https://publications.hereon.de/id/15522/
Authors:Schwenke, H., Knoth, J.
Year:1988
In: The Federation of Analytical Chemistry: FACSS XV.
Location:Boston, MA (USA)
Date:November 1-4, 1988
Cite as: Schwenke, H.; Knoth, J.: Trace and surface analysis by total reflection XRF. In: The Federation of Analytical Chemistry: FACSS XV.. Boston, MA (USA), November 1-4, 1988, 1988.
