Total reflection x-ray fluorescence spectrometry, a new technique for quantitative surface analysis
No abstract available.
URL: https://publications.hereon.de/id/15521/
Authors:Schwenke, H., Knoth, J., Weisbrod, U.
Year:1990
In: Sixth International Conference for Quantitative Surface Analysis
Location:London (GB)
Date:November 13-16, 1990
Cite as: Schwenke, H.; Knoth, J.; Weisbrod, U.: Total reflection x-ray fluorescence spectrometry, a new technique for quantitative surface analysis. In: Sixth International Conference for Quantitative Surface Analysis. London (GB), November 13-16, 1990, 1990.
