Some potential developments for trace element and surface analysis using a grazing incident X-ray beam
No abstract available.
URL: https://publications.hereon.de/id/15517/
Authors:Schwenke, H., Bormann, R., Knoth, J., Prange, A.
Year:1992
In: The 4th Workshop on Total-Reflection X-Ray Fluorescence Spectrometry; Book of Abstracts
Location:Geesthacht (D)
Date:12.-15.05.1992
Cite as: Schwenke, H.; Bormann, R.; Knoth, J.; Prange, A.: Some potential developments for trace element and surface analysis using a grazing incident X-ray beam. In: The 4th Workshop on Total-Reflection X-Ray Fluorescence Spectrometry; Book of Abstracts. Geesthacht (D), 12.-15.05.1992, 1992.
