Depth profiling in the uppermost surface zones using total reflection X-ray fluorescence spectrometry
No abstract available.
URL: https://publications.hereon.de/id/15514/
Authors:Schwenke, H.,Beaven, P.,Knoth, J.
Year:1997
In: International Workshop on Nanometer-scale Methods in X-ray Technology
Location:Lisbon (P)
Date:October 6-9, 1997
Type:conference lecture
Cite as: Schwenke, H.; Beaven, P.; Knoth, J.: Depth profiling in the uppermost surface zones using total reflection X-ray fluorescence spectrometry. International Workshop on Nanometer-scale Methods in X-ray Technology. Lisbon (P), 1997.
