Principles and applications of TXRF for trace element analysis: State of the art
No abstract available.
URL: https://publications.hereon.de/id/15105/
Authors:Prange, A.
Year:1994
In: National Institute of Standards and Technology (NIST)
Location:Gaithersburg, MD (USA)
Date:24.02.1994
Cite as: Prange, A.: Principles and applications of TXRF for trace element analysis: State of the art. In: National Institute of Standards and Technology (NIST). Gaithersburg, MD (USA), 24.02.1994, 1994.
