Finite element analyses to determine calibration curves for the measurement of the depth of semicircular and ellipsoideal surface cracks by d.c. potential method
No abstract available.
URL: https://publications.hereon.de/id/13765/
Authors:Dietrich, R. A.
Year:1989
In: 7th Conference on Nonlinear Finite Element Analyses and ADINA
Location:Cambridge, MA (USA)
Date:August 2-4, 1989
Type:conference lecture (invited)
Cite as: Dietrich, R.: Finite element analyses to determine calibration curves for the measurement of the depth of semicircular and ellipsoideal surface cracks by d.c. potential method. 7th Conference on Nonlinear Finite Element Analyses and ADINA. Cambridge, MA (USA), 1989.
