Concentration-depth profiling using toal-reflection X-ray fluorescence spectrometry in combination with ion-beam microsectioning techiques

journal article

No abstract available.

URL: https://publications.hereon.de/id/13263/
Authors:Wiener, G.,Michaelsen, C.,Knoth, J.,Schwenke, H.,Bormann, R.
Year:1995
In: Review of Scientific Instruments
Volume:66
Issue:1
Pages:20-23
Type:journal article
ISSN: 0034-6748
Cite as: Wiener, G.; Michaelsen, C.; Knoth, J.; Schwenke, H.; Bormann, R.: Concentration-depth profiling using toal-reflection X-ray fluorescence spectrometry in combination with ion-beam microsectioning techiques. Review of Scientific Instruments. 1995. vol. 66, no. 1, 20-23.