Burger
Journalpaper

Concentration-depth profiling using toal-reflection X-ray fluorescence spectrometry in combination with ion-beam microsectioning techiques

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  • URL: https://publications.hereon.de/id/13263/
  • Authors:Wiener, G., Michaelsen, C., Knoth, J., Schwenke, H., Bormann, R.
  • Year:1995
  • In: Review of Scientific Instruments
  • Volume:66
  • Issue:1
  • Pages: 20 - 23
  • Type:Journalpaper
  • ISSN: 0034-6748
  • Cite as: Wiener, G.; Michaelsen, C.; Knoth, J.; Schwenke, H.; Bormann, R.: Concentration-depth profiling using toal-reflection X-ray fluorescence spectrometry in combination with ion-beam microsectioning techiques. In: Review of Scientific Instruments. Vol. 66 (1995) 1, 20 - 23.
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