X-ray induced fluorescence spectrometry at grazing incidence for quantitative surface layer analysis

journal article,GKSS report

No abstract available.

URL: https://publications.hereon.de/id/13245/
Authors:Weisbrod, U.,Gutschke, R.,Knoth, J.,Schwenke, H.
Year:1991
In: Fresenius Journal of Analytical Chemistry
Volume:341
Issue:12
Pages:83-96
Type:journal article,GKSS report
ISSN: 0937-0633
Cite as: Weisbrod, U.; Gutschke, R.; Knoth, J.; Schwenke, H.: X-ray induced fluorescence spectrometry at grazing incidence for quantitative surface layer analysis. Fresenius Journal of Analytical Chemistry. 1991. vol. 341, no. 12, 83-96.