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Journalpaper

Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis

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  • URL: https://publications.hereon.de/id/13244/
  • Authors:Weisbrod, U., Gutschke, R., Knoth, J., Schwenke, H.
  • Year:1991
  • In: Applied Physics A
  • Volume:53
  • Pages: 449-456
  • Type:Journalpaper
  • ISSN: 0947-8396
  • Cite as: Weisbrod, U.; Gutschke, R.; Knoth, J.; Schwenke, H.: Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis. In: Applied Physics A. Vol. 53 (1991) 449-456.
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