Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis

journal article,GKSS report

No abstract available.

URL: https://publications.hereon.de/id/13244/
Authors:Weisbrod, U.,Gutschke, R.,Knoth, J.,Schwenke, H.
Year:1991
In: Applied Physics A
Volume:53
Pages:449-456
Type:journal article,GKSS report
ISSN: 0947-8396
Cite as: Weisbrod, U.; Gutschke, R.; Knoth, J.; Schwenke, H.: Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis. Applied Physics A. 1991. vol. 53, 449-456.