Depth Profiling in Surfaces Using Total Reflection X-Ray Fluorescence

journal article

No abstract available.

URL: https://publications.hereon.de/id/13052/
Authors:Schwenke, H.,Knoth, J.
Year:1995
In: Analytical Sciences
Volume:11
Pages:533-537
Type:journal article
ISSN: 0910-6340
Cite as: Schwenke, H.; Knoth, J.: Depth Profiling in Surfaces Using Total Reflection X-Ray Fluorescence. Analytical Sciences. 1995. vol. 11, 533-537.