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Journalpaper

Depth Profiling in Surfaces Using Total Reflection X-Ray Fluorescence

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  • URL: https://publications.hereon.de/id/13052/
  • Authors:Schwenke, H., Knoth, J.
  • Year:1995
  • In: Analytical Sciences
  • Volume:11
  • Pages: 533 - 537
  • Type:Journalpaper
  • ISSN: 0910-6340
  • Cite as: Schwenke, H.; Knoth, J.: Depth Profiling in Surfaces Using Total Reflection X-Ray Fluorescence. In: Analytical Sciences. Vol. 11 (1995) 533 - 537.
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