Depth profiling in surfaces using TXRF

Journalpaper

No abstract available.

URL: https://publications.hereon.de/id/13051/
Authors:Schwenke, H., Knoth, J.
Year:1994
In: Advances in X-Ray Chemical Analysis (Japan)
Volume:261
Pages: 137 - 144
Type:Journalpaper
ISSN: 0911-7806
Cite as: Schwenke, H.; Knoth, J.: Depth profiling in surfaces using TXRF. In: Advances in X-Ray Chemical Analysis (Japan). Vol. 261 (1994) 137 - 144.