Depth profiling in surfaces using TXRF

• URL: https://publications.hereon.de/id/13051/
• Authors:Schwenke, H.,Knoth, J.
• Year:1994
• In: Advances in X-Ray Chemical Analysis (Japan)
• Volume:261
• Pages:137-144
• Type:journal article
• ISSN: 0911-7806
• Cite as: Schwenke, H.; Knoth, J.: Depth profiling in surfaces using TXRF. Advances in X-Ray Chemical Analysis (Japan). 1994. vol. 261, 137-144.

•  Export Excel
•  Export Endnote
•  Export BibTex