Treatment of roughness and concentration gradients in total reflection X-ray fluorescence analysis of surfaces

journal article,GKSS report

No abstract available.

URL: https://publications.hereon.de/id/13049/
Authors:Schwenke, H.,Gutschke, R.,Knoth, J.,Kock, M.
Year:1992
In: Applied Physics A
Volume:54
Pages:460-465
Type:journal article,GKSS report
ISSN: 0947-8396
Cite as: Schwenke, H.; Gutschke, R.; Knoth, J.; Kock, M.: Treatment of roughness and concentration gradients in total reflection X-ray fluorescence analysis of surfaces. Applied Physics A. 1992. vol. 54, 460-465.