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Journalpaper

Treatment of roughness and concentration gradients in total reflection X-ray fluorescence analysis of surfaces

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  • URL: https://publications.hereon.de/id/13049/
  • Authors:Schwenke, H., Gutschke, R., Knoth, J., Kock, M.
  • Year:1992
  • In: Applied Physics A
  • Volume:54
  • Pages: 460-465
  • Type:Journalpaper
  • ISSN: 0947-8396
  • Cite as: Schwenke, H.; Gutschke, R.; Knoth, J.; Kock, M.: Treatment of roughness and concentration gradients in total reflection X-ray fluorescence analysis of surfaces. In: Applied Physics A. Vol. 54 (1992) 460-465.
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