The potential of TXRF as a primary method in chemical metrology
No abstract available.
URL: https://publications.hereon.de/id/12757/
Authors:Neidhart, B., Knoth, J., Schwenke, H.
Year:1998
In: Accreditation and Quality Assurance
Volume:3
Issue:11
Pages: 470 - 472
Type:Journalpaper
ISSN: 0949-1775
Cite as: Neidhart, B.; Knoth, J.; Schwenke, H.: The potential of TXRF as a primary method in chemical metrology. In: Accreditation and Quality Assurance. Vol. 3 (1998) 11, 470 - 472.
