Trace analysis of geological and environmental samples by total-reflection X-ray flourescence spectrometry

journal article,GKSS report

No abstract available.

URL: https://publications.hereon.de/id/12732/
Authors:Michaelis, W.,Prange, A.
Year:1988
In: Nuclear Geophysics
Volume:2
Issue:4
Pages:231-245
Type:journal article,GKSS report
ISSN: 0886-0130
Cite as: Michaelis, W.; Prange, A.: Trace analysis of geological and environmental samples by total-reflection X-ray flourescence spectrometry. Nuclear Geophysics. 1988. vol. 2, no. 4, 231-245.