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Journalpaper

Trace analysis of geological and environmental samples by total-reflection X-ray flourescence spectrometry

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  • URL: https://publications.hereon.de/id/12732/
  • Authors:Michaelis, W., Prange, A.
  • Year:1988
  • In: Nuclear Geophysics
  • Volume:2
  • Issue:4
  • Pages: 231-245
  • Type:Journalpaper
  • ISSN: 0886-0130
  • Cite as: Michaelis, W.; Prange, A.: Trace analysis of geological and environmental samples by total-reflection X-ray flourescence spectrometry. In: Nuclear Geophysics. Vol. 2 (1988) 4, 231-245.
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