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Journalpaper

Examination of layered structures by total reflection X-ray fluorescence analysis

No abstract available.
  • URL: https://publications.hereon.de/id/12490/
  • Authors:Knoth, J., Bormann, R., Gutschke, R., Michaelsen, C., Schwenke, H.
  • Year:1993
  • In: Spectrochimica Acta B
  • Volume:48
  • Issue:2
  • Pages: 285-292
  • Type:Journalpaper
  • ISSN: 0584-8547
  • Cite as: Knoth, J.; Bormann, R.; Gutschke, R.; Michaelsen, C.; Schwenke, H.: Examination of layered structures by total reflection X-ray fluorescence analysis. In: Spectrochimica Acta B. Vol. 48 (1993) 2, 285-292.
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