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journal article
Interfacial Wetting and Perlocation Threshold in Ultrathin Ni/C Multilayer Films
No abstract available.
URL:
https://publications.hereon.de/id/1082/
Authors:
Borchers, C.,Ricardo, P.,Michaelsen, C.
Year:
2000
In:
Philosophical Magazine A
Volume:
80
Issue:
7
Pages:
1669-1679
Type:
journal article
ISSN:
0141-8610
Cite as:
Borchers, C.; Ricardo, P.; Michaelsen, C.: Interfacial Wetting and Perlocation Threshold in Ultrathin Ni/C Multilayer Films. Philosophical Magazine A. 2000. vol. 80, no. 7, 1669-1679.
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