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conference paper

Microstructure evolution during solid-state reactions in polycrystalline Nb/Al and Ti/Al multilayer thin films

No abstract available.
  • URL: https://publications.hereon.de/id/1046/
  • Authors:Lucadamo, G.,Barmak, K.,Carpenter, D.T.,Lavoie, C.,Babral, C.,Michaelsen, C.,Rickman, J.M.
  • Year:1999
  • In: Materials Research Society Symposium Proceeding, MRS Spring Meeting 1999
  • Volume:562
  • Location:San Francisco, CA (USA)
  • Date:05.-09.04.1999
  • Pages:159-164
  • Type:conference paper
  • Cite as: Lucadamo, G.; Barmak, K.; Carpenter, D.; Lavoie, C.; Babral, C.; Michaelsen, C.; Rickman, J.: Microstructure evolution during solid-state reactions in polycrystalline Nb/Al and Ti/Al multilayer thin films. In: Materials Research Society Symposium Proceeding, MRS Spring Meeting 1999. San Francisco, CA (USA). 1999. 159-164.
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