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Confpaper
Microstructure evolution during solid-state reactions in polycrystalline Nb/Al and Ti/Al multilayer thin films
No abstract available.
URL:
https://publications.hereon.de/id/1046/
Authors:
Lucadamo, G., Barmak, K., Carpenter, D.T., Lavoie, C., Babral, C., Michaelsen, C., Rickman, J.M.
Year:
1999
In:
Materials Research Society Symposium Proceeding, MRS Spring Meeting 1999
Volume:
562
Location:
San Francisco, CA (USA)
Date:
05.-09.04.1999
Pages:
159 - 164
Type:
Confpaper
Cite as:
Lucadamo, G.; Barmak, K.; Carpenter, D.T.; Lavoie, C.; Babral, C.; Michaelsen, C.; Rickman, J.M.: Microstructure evolution during solid-state reactions in polycrystalline Nb/Al and Ti/Al multilayer thin films. In: Materials Research Society Symposium Proceeding, MRS Spring Meeting 1999. Vol. 562 San Francisco, CA (USA), 05.-09.04.1999, 1999. 159 - 164.
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