%0 journal article
%@ 1600-5775
%A Flenner, S., Hagemann, J., Wittwer, F., Longo, E., Kubec, A., Rothkirch, A., David, C., Müller, M., Greving, I.

%D 2023
%J Journal of Synchrotron Radiation
%N 2
%P 390-399 
%R doi:10.1107/S1600577522012103
%T Hard X-ray full-field nanoimaging using a direct photon-counting detector
%U https://doi.org/10.1107/S1600577522012103
2 
%X Full-field X-ray nanoimaging is a widely used tool in a broad range of scientific areas. In particular, for low-absorbing biological or medical samples, phase contrast methods have to be considered. Three well established phase contrast methods at the nanoscale are transmission X-ray microscopy with Zernike phase contrast, near-field holography and near-field ptychography. The high spatial resolution, however, often comes with the drawback of a lower signal-to-noise ratio and significantly longer scan times, compared with microimaging. In order to tackle these challenges a single-photon-counting detector has been implemented at the nanoimaging endstation of the beamline P05 at PETRA III (DESY, Hamburg) operated by Helmholtz-Zentrum Hereon. Thanks to the long sample-to-detector distance available, spatial resolutions of below 100 nm were reached in all three presented nanoimaging techniques. This work shows that a single-photon-counting detector in combination with a long sample-to-detector distance allows one to increase the time resolution for in situ nanoimaging, while keeping a high signal-to-noise level.