%0 journal article
%@ 1600-5775
%A Wolf, A., Akstaller, B., Cipiccia, S., Flenner, S., Hagemann, J., Ludwig, V., Meyer, P., Schropp, A., Schuster, M., Seifert, M., Weule, M., Michel, T., Anton, G., Funk, S.

%D 2022
%J Journal of Synchrotron Radiation
%N 3
%P 794-806 
%R doi:10.1107/S160057752200193X
%T Single-exposure X-ray phase imaging microscopy with a grating interferometer
%U https://doi.org/10.1107/S160057752200193X
3 
%X The advent of hard X-ray free-electron lasers enables nanoscopic X-ray imaging with sub-picosecond temporal resolution. X-ray grating interferometry offers a phase-sensitive full-field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is attractive for imaging applications at X-ray free-electron lasers where intrinsic pulse-to-pulse fluctuations pose a major challenge. In this work, the single-exposure phase imaging capabilities of grating interferometry are characterized by an implementation at the I13-1 beamline of Diamond Light Source (Oxfordshire, UK). For comparison purposes, propagation-based phase contrast imaging was also performed at the same instrument. The characterization is carried out in terms of the quantitativeness and the contrast-to-noise ratio of the phase reconstructions as well as via the achievable spatial resolution. By using a statistical image reconstruction scheme, previous limitations of grating interferometry regarding the spatial resolution can be mitigated as well as the experimental applicability of the technique.