@misc{wolf_singleexposure_xray_2022, 
author={Wolf, A., Akstaller, B., Cipiccia, S., Flenner, S., Hagemann, J., Ludwig, V., Meyer, P., Schropp, A., Schuster, M., Seifert, M., Weule, M., Michel, T., Anton, G., Funk, S.},
title={Single-exposure X-ray phase imaging microscopy with a grating interferometer},
year={2022},
howpublished = {journal article},
doi = {https://doi.org/10.1107/S160057752200193X},
abstract = {The advent of hard X-ray free-electron lasers enables nanoscopic X-ray imaging with sub-picosecond temporal resolution. X-ray grating interferometry offers a phase-sensitive full-field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is attractive for imaging applications at X-ray free-electron lasers where intrinsic pulse-to-pulse fluctuations pose a major challenge. In this work, the single-exposure phase imaging capabilities of grating interferometry are characterized by an implementation at the I13-1 beamline of Diamond Light Source (Oxfordshire, UK). For comparison purposes, propagation-based phase contrast imaging was also performed at the same instrument. The characterization is carried out in terms of the quantitativeness and the contrast-to-noise ratio of the phase reconstructions as well as via the achievable spatial resolution. By using a statistical image reconstruction scheme, previous limitations of grating interferometry regarding the spatial resolution can be mitigated as well as the experimental applicability of the technique.},
note = {Online available at: \url{https://doi.org/10.1107/S160057752200193X} (DOI). Wolf, A.; Akstaller, B.; Cipiccia, S.; Flenner, S.; Hagemann, J.; Ludwig, V.; Meyer, P.; Schropp, A.; Schuster, M.; Seifert, M.; Weule, M.; Michel, T.; Anton, G.; Funk, S.: Single-exposure X-ray phase imaging microscopy with a grating interferometer. Journal of Synchrotron Radiation. 2022. vol. 29, no. 3, 794-806. DOI: 10.1107/S160057752200193X}}