%0 journal article
%@ 2041-1723
%A Günther, B., Hehn, L., Jud, C., Hipp, A., Dierolf, M., Pfeiffer, F.

%D 2019
%J Nature Communications
%N 1
%P 2494 
%R doi:10.1038/s41467-019-10537-x
%T Full-field structured-illumination super-resolution X-ray transmission microscopy
%U https://doi.org/10.1038/s41467-019-10537-x
1 
%X Modern transmission X-ray microscopy techniques provide very high resolution at low and medium X-ray energies, but suffer from a limited field-of-view. If sub-micrometre resolution is desired, their field-of-view is typically limited to less than one millimetre. Although the field-of-view increases through combining multiple images from adjacent regions of the specimen, so does the required data acquisition time. Here, we present a method for fast full-field super-resolution transmission microscopy by structured illumination of the specimen. This technique is well-suited even for hard X-ray energies above 30 keV, where efficient optics are hard to obtain. Accordingly, investigation of optically thick specimen becomes possible with our method combining a wide field-of-view spanning multiple millimetres, or even centimetres, with sub-micron resolution and hard X-ray energies.