@misc{gnther_fullfield_structuredillumination_2019, 
author={Günther, B., Hehn, L., Jud, C., Hipp, A., Dierolf, M., Pfeiffer, F.},
title={Full-field structured-illumination super-resolution X-ray transmission microscopy},
year={2019},
howpublished = {journal article},
doi = {https://doi.org/10.1038/s41467-019-10537-x},
abstract = {Modern transmission X-ray microscopy techniques provide very high resolution at low and medium X-ray energies, but suffer from a limited field-of-view. If sub-micrometre resolution is desired, their field-of-view is typically limited to less than one millimetre. Although the field-of-view increases through combining multiple images from adjacent regions of the specimen, so does the required data acquisition time. Here, we present a method for fast full-field super-resolution transmission microscopy by structured illumination of the specimen. This technique is well-suited even for hard X-ray energies above 30 keV, where efficient optics are hard to obtain. Accordingly, investigation of optically thick specimen becomes possible with our method combining a wide field-of-view spanning multiple millimetres, or even centimetres, with sub-micron resolution and hard X-ray energies.},
note = {Online available at: \url{https://doi.org/10.1038/s41467-019-10537-x} (DOI). Günther, B.; Hehn, L.; Jud, C.; Hipp, A.; Dierolf, M.; Pfeiffer, F.: Full-field structured-illumination super-resolution X-ray transmission microscopy. Nature Communications. 2019. vol. 10, no. 1, 2494. DOI: 10.1038/s41467-019-10537-x}}