%0 journal article
%@ 0255-5476
%A Staron, P., Fischer, T., Keckes, J., Schratter, S., Hatzenbichler, T., Schell, N., Mueller, M., Schreyer, A.

%D 2014
%J Materials Science Forum, International Conference on Residual Stresses 9

%P 72-75 
%R doi:10.4028/www.scientific.net/MSF.768-769.72
%T Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cell
%U https://doi.org/10.4028/www.scientific.net/MSF.768-769.72
 
%X A conical slit cell for depth-resolved diffraction of high-energy X-rays was used for residual stress analysis at the high-energy materials science synchrotron beamline HEMS at PETRA III. With a conical slit width of 20 µm and beam cross-sections of 50 µm, a spatial resolution in beam direction of 0.8 mm was achieved. The setup was used for residual stress analysis in a drawn steel wire with 8.3 mm diameter. The residual stress results were in very good agreement with results of a FE simulation.