@misc{staron_depthresolved_residual_2012, 
author={Staron, P., Fischer, T., Keckes, J., Schratter, S., Hatzenbichler, T., Schell, N., Mueller, M., Schreyer, A.},
title={Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cell},
year={2012},
howpublished = {conference lecture: Garmisch-Partenkirchen (D);},
note = {Staron, P.; Fischer, T.; Keckes, J.; Schratter, S.; Hatzenbichler, T.; Schell, N.; Mueller, M.; Schreyer, A.: Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cell. International Conference on Residual Stress, ICRS-9. Garmisch-Partenkirchen (D), 2012.}}