@misc{marschall_xray_full_2014, 
author={Marschall, F., Last, A., Simon, M., Kluge, M., Nazmov, V., Vogt, H., Ogurreck, M., Greving, I., Mohr, J.},
title={X-ray Full Field Microscopy at 30 keV},
year={2014},
howpublished = {journal article},
doi = {https://doi.org/10.1088/1742-6596/499/1/012007},
abstract = {In our X-ray full field microscopy experiments, we demonstrated a resolution better than 260 nm over the entire field of view of 80 μm × 80 μm at 30 keV. Our experimental setup at PETRA III, P05, had a length of about 5 m consisting of an illumination optics, an imaging lens and a detector. For imaging, we used a compound refractive lens (CLR) consisting of mr-L negative photo resist, which was fabricated by deep X-ray lithography. As illumination optics, we choose a refractive rolled X-ray prism lens, which was adapted to the numerical aperture of the imaging lens.},
note = {Online available at: \url{https://doi.org/10.1088/1742-6596/499/1/012007} (DOI). Marschall, F.; Last, A.; Simon, M.; Kluge, M.; Nazmov, V.; Vogt, H.; Ogurreck, M.; Greving, I.; Mohr, J.: X-ray Full Field Microscopy at 30 keV. Journal of Physics: Conference Series. 2014. vol. 499, 012007. DOI: 10.1088/1742-6596/499/1/012007}}