%0 conference lecture
%@ 
%A Marschall, F., Last, A., Simon, M., Kluge, M., Nazmov, V., Vogt, H., Ogurreck, M., Greving, I., Mohr, J.

%D 2013
%J 22nd International Congress on X-Ray Optics and Microanalysis, ICXOM 2013

 

%T X-ray Full Field Microscopy at 30 keV
%U 
 
%X