%0 conference lecture
%@ 
%A Gabrisch, H.,Mayer, S.,Pyczak, F.,Rackel, M.,Lorenz, U.,Schell, N.,Schreyer, A.,Stark, A.
%D 2013
%J Microscopy Conference, MC 2013
%N 
%P  

%T Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging
%U 
 
%X