@misc{gabrisch_characterization_of_2013, author={Gabrisch, H., Mayer, S., Pyczak, F., Rackel, M., Lorenz, U., Schell, N., Schreyer, A., Stark, A.}, title={Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging}, year={2013}, howpublished = {conference lecture: Regensburg (D);}, note = {Gabrisch, H.; Mayer, S.; Pyczak, F.; Rackel, M.; Lorenz, U.; Schell, N.; Schreyer, A.; Stark, A.: Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging. Microscopy Conference, MC 2013. Regensburg (D), 2013.}}