%0 journal article
%@ 0146-9592
%A Gaudin, J., Ozkan, C., Chalupsky, J., Bajt, S., Burian, T., Vysin, L., CoppolaN., Dastjani-Farahani, S., Chapman, H.N., Galasso, G., Hajkova, V., Harmand, M., Juha, L., Jurek, M., Loch, R.A., Moeller, S., Nagasono, M., Stoermer, M., Sinn, H., Saksl, K., Sobierajski, R., Schulz, J., Sovak, P., Toleikis, S., Tiedtke, K., Tschentscher, T., Krzywinski, J.

%D 2012
%J Optics Letters
%N 15
%P 3033-3035 
%R doi:10.1364/OL.37.003033
%T Investigating the interaction of x-ray free electron laser radiation with grating structure
%U https://doi.org/10.1364/OL.37.003033
15 
%X at the edge of the grating structure as evidenced by optical and atomic force microscopy. Simulations based on solution of the Helmholtz equation demonstrate an enhancement of the electric field intensity distribution at the edge of the grating structure. A procedure is finally deduced to evaluate damage threshold.