@misc{chalupsky_spot_size_2010, 
author={Chalupsky, J., Krzywinski, J., Juha, L., Hajkova, V., Cihelka, J., Burian, T., Vysín, L., Gaudin, J., Gleeson, A., Jurek,  M., Khorsand, A. R., Klinger, D., Wabnitz, H., Sobierajski, R., Stoermer, M., Tiedtke, K., Toleikis, S.},
title={Spot size characterization of focused non-Gaussian X-ray laser beams},
year={2010},
howpublished = {journal article},
doi = {https://doi.org/10.1364/OE.18.027836},
abstract = {We present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the beam spot area we apply and refine the definition of so called effective area (Aeff) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which is inappropriate for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft X-ray free-electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination are presented in this work. An F-scan method, newly developed in this paper, appears to be a good candidate for the spatial beam diagnostics applicable to lasers of various kinds.},
note = {Online available at: \url{https://doi.org/10.1364/OE.18.027836} (DOI). Chalupsky, J.; Krzywinski, J.; Juha, L.; Hajkova, V.; Cihelka, J.; Burian, T.; Vysín, L.; Gaudin, J.; Gleeson, A.; Jurek, M.; Khorsand, A.; Klinger, D.; Wabnitz, H.; Sobierajski, R.; Stoermer, M.; Tiedtke, K.; Toleikis, S.: Spot size characterization of focused non-Gaussian X-ray laser beams. Optics express. 2010. vol. 18, no. 26, 27836-27845. DOI: 10.1364/OE.18.027836}}