%0 conference paper
%@ 
%A Cihelka, J., Juha, L., Chalupsky, J., Rosmej, F.B., Renner, O., Saksl, K., Hajkova, V., Vysin, L., Galtier, E., Schott, R., Khorsand, A.R., Riley, D., Dzelzainis, T., Nelson, A., Lee, R.W., Heimann, P., Nagler, B., Vinko, S., Wark, J., Whitcher, T., Toleikis, S., Tschentscher, T., Faustlin, R., Wabnitz, H., Bajt, S., Chapman, H., Krzywinski, J., Sobierajski, R., Klinger, D., Jurek, M., Pelka, J., Hau-Riege, S., London, R.A., Kuba, J., Stojanovic, N., Sokolowski-Tinten, K., Gleeson, A.J., Stoermer, M., Andreasson, J., Hajdu, J., Iwan, B., Timneanu, N.

%D 2009
%J Proceedings of SPIE, International Conference on Damage to VUV, EUV, and X-Ray Optics II

%P 73610P 
%R doi:10.1117/12.822766
%T Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser
%U https://doi.org/10.1117/12.822766
 
%X