@misc{cihelka_optical_emission_2009, 
author={Cihelka, J., Juha, L., Chalupsky, J., Rosmej, F.B., Renner, O., Saksl, K., Hajkova, V., Vysin, L., Galtier, E., Schott, R., Khorsand, A.R., Riley, D., Dzelzainis, T., Nelson, A., Lee, R.W., Heimann, P., Nagler, B., Vinko, S., Wark, J., Whitcher, T., Toleikis, S., Tschentscher, T., Faustlin, R., Wabnitz, H., Bajt, S., Chapman, H., Krzywinski, J., Sobierajski, R., Klinger, D., Jurek, M., Pelka, J., Hau-Riege, S., London, R.A., Kuba, J., Stojanovic, N., Sokolowski-Tinten, K., Gleeson, A.J., Stoermer, M., Andreasson, J., Hajdu, J., Iwan, B., Timneanu, N.},
title={Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser},
year={2009},
howpublished = {conference paper: Prag  (CZ);},
doi = {https://doi.org/10.1117/12.822766},
note = {Online available at: \url{https://doi.org/10.1117/12.822766} (DOI). Cihelka, J.; Juha, L.; Chalupsky, J.; Rosmej, F.; Renner, O.; Saksl, K.; Hajkova, V.; Vysin, L.; Galtier, E.; Schott, R.; Khorsand, A.; Riley, D.; Dzelzainis, T.; Nelson, A.; Lee, R.; Heimann, P.; Nagler, B.; Vinko, S.; Wark, J.; Whitcher, T.; Toleikis, S.; Tschentscher, T.; Faustlin, R.; Wabnitz, H.; Bajt, S.; Chapman, H.; Krzywinski, J.; Sobierajski, R.; Klinger, D.; Jurek, M.; Pelka, J.; Hau-Riege, S.; London, R.; Kuba, J.; Stojanovic, N.; Sokolowski-Tinten, K.; Gleeson, A.; Stoermer, M.; Andreasson, J.; Hajdu, J.; Iwan, B.; Timneanu, N.: Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser. In: Juha, L.; Bajt, S.; Sobierajski, R. (Ed.): Proceedings of SPIE, International Conference on Damage to VUV, EUV, and X-Ray Optics II. Prag  (CZ). 2009. 73610P. DOI: 10.1117/12.822766}}