%0 conference paper
%@ 
%A Juha, L., Hajkova, V., Chalupsky, J., Vorlicek, V., Ritucci, A., Reale, A., Zuppella, P., Stoermer, M.

%D 2007
%J Proceeding SPIE, International Congress on Optics and Optoelectronics 2007, Damage to VUV, EUV, and X-ray Optics

%P 65860D 

%T Capillary-discharge 46.9-nm laser-induced damage to a-C thin films exposed to multiple laser shots below single-shot damage threshold
%U 
 
%X