@misc{schroer_fullfield_and_2006, 
author={Schroer, C.G., Kuhlmann, M., Guenzler, T.F., Benner, B., Kurapova, C., Patommel, J., Lengeler, B., Roth, S.V., Gehrke, R., Snigirev, A., Snigireva, I., Almendarez-Camarillo, A., Beckmann, F.},
title={Full-Field and Scanning Microtomography Based on Parabolic Refractive X-Ray Lenses},
year={2006},
howpublished = {conference lecture: San Diego, CA (USA);},
note = {Schroer, C.; Kuhlmann, M.; Guenzler, T.; Benner, B.; Kurapova, C.; Patommel, J.; Lengeler, B.; Roth, S.; Gehrke, R.; Snigirev, A.; Snigireva, I.; Almendarez-Camarillo, A.; Beckmann, F.: Full-Field and Scanning Microtomography Based on Parabolic Refractive X-Ray Lenses. Optics and Photonics, SPIE 2006. San Diego, CA (USA), 2006.}}