%0 conference paper
%@ 
%A Donath, T., Beckmann, F., Heijkants, R.G.J.C., Brunke, O., Schreyer, A.

%D 2004
%J SPIE 49th Annual Meeting, Optical Scienece and Technology, Developments in X-Ray Tomography IV

%P 91 

%T Characterization of polyurethane scaffolds using synchrotron radiation computed microtomography
%U 
 
%X