%0 Artikel
%@ 0584-8547
%A Schwenke, H.
%A  Beaven, P.
%A  Knoth, J.
%A  Jantzen, E.

%D 2003
%J Spectrochimica Acta  A
%N 1722
%P 2039 - 2048 
%R doi:10.1016/S0584-8547(03)00188-5
%T A Wavelength-dispersive Arrangement for Wafer Analysis with Total Reflection X-ray Fluorescence Spectrometry using Synchrotron Radiation 
%U http://dx.doi.org/10.1016/S0584-8547(03)00188-5
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%X