%0 conference lecture
%@ 
%A Jacobi, S., Wiesmann, J., Steeg, B., Stoermer, M., Feldhaus, J., Michaelsen, C.

%D 2002
%J Spie´s Annual Meeting, Spie´s International Symposium on Optical Science and Technology

 

%T Characterization of carbon films as total-reflection mirrors for XUV Free Electron Lasers
%U 
 
%X