@inproceedings{jacobi_characterization_of_2002, 
author={Jacobi, S. and Wiesmann, J. and Steeg, B. and Stoermer, M. and Feldhaus, J. and Michaelsen, C.},
title={Characterization of carbon films as total-reflection mirrors for XUV Free Electron Lasers},
year={2002},
booktitle = {Spie´s Annual Meeting, Spie´s International Symposium on Optical Science and Technology},
note = {Jacobi, S.; Wiesmann, J.; Steeg, B.; Stoermer, M.; Feldhaus, J.; Michaelsen, C.: Characterization of carbon films as total-reflection mirrors for XUV Free Electron Lasers. In: Spie´s Annual Meeting, Spie´s International Symposium on Optical Science and Technology. Seattle, WA (USA), 07.-11.07.2002, 2002.}}