%0 conference paper
%@ 
%A Schillinger, W., Zhang, D., Dehm, G., Bartels, A., Clemens, H.

%D 2001
%J Materials Research Society Symposium

 

%T Creep Behavior and Microstructural Stability of Lamellar Gamma-TiAl (Cr, Mo, SI, B) with Extremely Fine Lamellar Spacing
%U 
 
%X