@misc{schuster_laterally_graded_1999, 
author={Schuster, M., Goebel, H., Bruegemann, L., Bahr, D., Burgaezy, F., Michaelsen, C., Stoermer,  M., Ricardo, P., Dietsch, R., Holz, T., Mai, H.},
title={Laterally graded multilayer optics for x-ray analysis},
year={1999},
howpublished = {conference paper: Denver, CO (USA);},
note = {Schuster, M.; Goebel, H.; Bruegemann, L.; Bahr, D.; Burgaezy, F.; Michaelsen, C.; Stoermer, M.; Ricardo, P.; Dietsch, R.; Holz, T.; Mai, H.: Laterally graded multilayer optics for x-ray analysis. In: SPIE, EUV, X-Ray, and Neutron Optics and Sources. Denver, CO (USA). 1999. 183-198.}}