@misc{schwenke_characterization_of_1992, 
author={Schwenke, H., Gutschke, R., Knoth, J.},
title={Characterization of near surface layers by means of total reflection X-ray fluorescence spectrometry},
year={1992},
howpublished = {GKSS report},
note = {Schwenke, H.; Gutschke, R.; Knoth, J.: Characterization of near surface layers by means of total reflection X-ray fluorescence spectrometry. In: Barrett, C.; Gilfrich, J.; Huang, T.; Jenkins, R.; McCarthy, G.; Predecki, P.; Ryon, R.; Smith, D. (Ed.): Advances in X-Ray Analysis: Proceedings of combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis. Hilo and Honolulu, HI (USA). 1992. 941-946.}}