@inproceedings{lucadamo_characterization_of_1996, 
author={Lucadamo, G. and Barmak, K. and Michaelsen, C.},
title={Characterization of reactive phase formation in sputter-deposited Ni/Al multilayer thin films using transmission electron microscopy},
year={1996},
booktitle = {Proceedings of Microscopy and Microanalysis 1996},
editor = {Bailey, G.W.; Corbett, J.M.; Dimlich, R.V.W.; Michael, J.R.; Zaluzec, N.J.},
pages = {1000 - 1001},
note = {Lucadamo, G.; Barmak, K.; Michaelsen, C.: Characterization of reactive phase formation in sputter-deposited Ni/Al multilayer thin films using transmission electron microscopy. In: Bailey, G.W.; Corbett, J.M.; Dimlich, R.V.W.; Michael, J.R.; Zaluzec, N.J. (Eds.): Proceedings of Microscopy and Microanalysis 1996. Minneapolis, MN (USA), August 11-15, 1996, 1996.  1000 - 1001.}}