@misc{wiener_ion_beam_1997, 
author={Wiener, G., Guenther, R., Michaelsen, C., Knoth, J., Schwenke, H., Bormann, R.},
title={Ion beam sputtering techniques for high-resolution concentration depth profiling with glancing-incidence X-ray fluorescence spectrometry},
year={1997},
howpublished = {journal article},
note = {Wiener, G.; Guenther, R.; Michaelsen, C.; Knoth, J.; Schwenke, H.; Bormann, R.: Ion beam sputtering techniques for high-resolution concentration depth profiling with glancing-incidence X-ray fluorescence spectrometry. Spectrochimica Acta  B. 1997. vol. 52, 813-821.}}