%0 conference lecture
%@ 
%A Marschall, F.,Last, A.,Simon, M.,Kluge, M.,Nazmov, V.,Vogt, H.,Ogurreck, M.,Greving, I.,Mohr, J.
%D 2013
%J 22nd International Congress on X-Ray Optics and Microanalysis, ICXOM 2013
%N 
%P  

%T X-ray Full Field Microscopy at 30 keV
%U 
 
%X