%0 conference paper
%@ 
%A Cihelka, J.,Juha, L.,Chalupsky, J.,Rosmej, F.B.,Renner, O.,Saksl, K.,Hajkova, V.,Vysin, L.,Galtier, E.,Schott, R.,Khorsand, A.R.,Riley, D.,Dzelzainis, T.,Nelson, A.,Lee, R.W.,Heimann, P.,Nagler, B.,Vinko, S.,Wark, J.,Whitcher, T.,Toleikis, S.,Tschentscher, T.,Faustlin, R.,Wabnitz, H.,Bajt, S.,Chapman, H.,Krzywinski, J.,Sobierajski, R.,Klinger, D.,Jurek, M.,Pelka, J.,Hau-Riege, S.,London, R.A.,Kuba, J.,Stojanovic, N.,Sokolowski-Tinten, K.,Gleeson, A.J.,Stoermer, M.,Andreasson, J.,Hajdu, J.,Iwan, B.,Timneanu, N.

%D 2009
%J Proceedings of SPIE, International Conference on Damage to VUV, EUV, and X-Ray Optics II
%N 
%P 73610P 
%R doi:10.1117/12.822766
%T Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser
%U https://doi.org/10.1117/12.822766
 
%X