%0 conference poster
%@ 
%A Haeussler, D.,Yang, S.,Spiecker, E.,Jaeger, W.,Stoermer, M.,Zwicker, G.

%D 2004
%J European Microscopy Congress, EMC 2004
%N 
%P  

%T Characterization of La/B4C multilayer systems by geometric phase method
%U 
 
%X