%0 conference lecture (invited)
%@ 
%A Schwenke, H.,Beaven, P.,Knoth, J.

%D 1998
%J 10th Working Conference on Applied Surface Analysis, AOFE 10
%N 
%P  

%T Applications of Total Reflection X-ray Fluorescence Spectrometry in Trace Element and Surface Analysis
%U 
 
%X